To meet the demands of measuring transient currents in semiconductors using new technology, such as SiC and GaN, Power Electronic Measurements Ltd. (PEM) has designed the CWT MiniHF Rogowski current probe. Combining a novel shielding technique, utilizing a low sensitivity coil and patented low-noise signal-conditioning circuitry, the wide-band screened probe boosts immunity to local dV/dt transients while maintaining small size, flexibility, and 3dB bandwidth of up to 30MHz for a 100mm coil. The probes feature a coil only 4.5mm thick with 5kV insulation voltage, and can handle maximum current slope of 100kA/µs.
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The new wide-band screened CWT MiniHF probe eliminates the extra bulk and bandwidth restrictions imposed by conventional screening techniques, while delivering the known advantages of a Rogowski coil. These include zero insertion impedance, isolated measurement, high peak-current rating, and the ability to measure small AC currents in the presence of large DC current.
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